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• W1980778972 abstract "Experiments on the thickness dependence variations in electrical resistance of thin rf sputtered zinc films before and after thermal ageing are consistent with a two-layers model: the first layer about 150 A thick is the thinner continuous layer that may be obtained; electronic conduction in the second layer occurs according to the Mayadas-Shatzkes model related to polycrystalline films with a constant grain size. The linearized equations and the ‘effective Fuchs-Sondheimer’ model previously reported are convenient tools for describing the conduction in the upper layer and allow an experimental determination of the carrier reflection coefficients at grain-boundaries and film surfaces." @default.
• W1980778972 created "2016-06-24" @default.
• W1980778972 creator A5079267066 @default.
• W1980778972 date "1978-01-01" @default.
• W1980778972 modified "2023-09-24" @default.
• W1980778972 title "Electrical conduction in thin zinc rf sputtered films" @default.
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• W1980778972 doi "https://doi.org/10.1016/s0042-207x(78)80706-4" @default.
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