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- W1981720322 abstract "Abstract Small is strong – the yield stresses of thin metall23ic films with sub-micron thickness greatlq exceed bulc values. While it is clear that this effect must be due to confinement effects on..." @default.
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- W1981720322 title "Dislocation dynamics in sub-micron confinement: recent progress in Cu thin film plasticity" @default.
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