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• W1982152805 abstract "In this work, we have investigated the influence of thickness on structural and electrical properties of Al-doped ZnO films. Transparent conducting oxide films were grown by the spray pyrolysis technique from precursors prepared via the sol–gel method. We determined the structural properties of the films by performing X-ray diffraction and mosaicity measurements, which evidenced an increase of disorder and inhomogeneity between crystalline domains as the films thickened. This behavior was contrasted with results obtained from electrical measurements and was attributed to plastic deformation of the films as their thickness increased. As a result, the carrier mobility, the optical gap and the activation energy are affected due to emerging grain boundaries and a higher degree of disorder." @default.
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• W1982152805 date "2015-01-01" @default.
• W1982152805 modified "2023-10-06" @default.
• W1982152805 title "Effect of thickness on structural and electrical properties of Al-doped ZnO films" @default.
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• W1982152805 doi "https://doi.org/10.1016/j.tsf.2014.12.013" @default.
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