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- W1982207890 abstract "Abstract The core structure of extended dislocation in Cd 0.9 Zn 0.1 Te was observed by high resolution transmission electron microscopy (HRTEM). The dissociate mechanism of basal dislocation in Cd 0.9 Zn 0.1 Te was studied by using Digital Micrograph (DM) software. Furthermore, stacking fault energy of Cd 0.9 Zn 0.1 Te single crystal was calculated to be 9.17 mJ/m 2 which is lower compared with the semiconductors with diamond structures, such as Si and Ge. The reason of low stacking fault energy of Cd 0.9 Zn 0.1 Te was investigated to be the increase of the fractional ionicity of the bonding by using Phillips theory." @default.
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- W1982207890 date "2012-08-01" @default.
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- W1982207890 title "Direct observation of extended dislocation in Cd0.9Zn0.1Te single crystals by HRTEM" @default.
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- W1982207890 doi "https://doi.org/10.1016/j.jcrysgro.2012.05.021" @default.
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