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• W1982582748 abstract "This study is concerned with the temperature dependent noise and responsivity performance of n-type x equals 0.32 Hg<SUB>1-x</SUB>Cd<SUB>x</SUB>Te photoconductors. The fundamental noise sources that ultimately limit the specific detectivity, D<SUB>(lambda</SUB> )<SUP>*</SUP>, at temperatures T > 80 K are identified and correlated with the experimental material parameters of the device. A device model is presented for the responsivity and noise voltage which takes into account surface effects such as surface recombination and accumulation layer shunting. The model is in good agreement with the experimental values over the full temperature range from 80 to 300 K. Using a combination of experimental results and model calculations, the optimum device thickness and free electron concentration are presented which maximize D<SUB>(lambda</SUB> )<SUP>*</SUP> for a given operating temperature. Furthermore, it is shown that under ideal conditions it is possible to achieve background limited performance at temperatures up to 210 K. Experimental results are presented for responsivity, noise voltage, semiconductor surface charge density and D<SUB>(lambda</SUB> )<SUP>*</SUP> for an n-type x equals 0.32 Hg<SUB>1-x</SUB>Cd<SUB>x</SUB>Te photoconductive detector as a function of temperature in the range 80 to 300 K. For a signal wavelength of 4 micrometer and a 40 degree field of view, a background limited D<SUB>(lambda</SUB> )<SUP>*</SUP> of 3.8 X 10<SUP>11</SUP> cmHz<SUP>1/2</SUP>W<SUP>-1</SUP> was obtained for temperatures up to 180 K, while D<SUB>(lambda</SUB> )<SUP>*</SUP> of 1.4 X 10<SUP>11</SUP> and 2 X 10<SUP>9</SUP> cmHz<SUP>1/2</SUP>W<SUP>-1</SUP> were measured at 200 K and 300 K, respectively." @default.
• W1982582748 created "2016-06-24" @default.
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• W1982582748 date "1995-09-08" @default.
• W1982582748 modified "2023-10-17" @default.
• W1982582748 title "<title>Midwavelength infrared Hg<formula><inf><roman>1-x</roman></inf></formula>Cd<formula><inf><roman>x</roman></inf></formula>Te photoconductor performance at T>80K</title>" @default.
• W1982582748 doi "https://doi.org/10.1117/12.218211" @default.
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