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• W1982687194 abstract "Abstract (110) MgO thin films have been deposited by RF sputtering on (110) SrTiO 3 and used as buffer layers for YBCO deposition. The MgO films show high morphological quality, as confirmed by X-ray specular reflectivity, and narrow (≈ 1°) X-ray diffraction peaks in the rocking curves measurements. These results are discussed in the framework of an ionic oxide growth model. XRD analyses performed on the bilayer YBCO/MgO (110) confirm the epitaxial growth of the films, with (001) YBCO//(110) MgO. XRD, AFM, SEM measurements are compared with data relative to bilayers deposited on (100) SrTiO 3 ." @default.
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• W1982687194 date "1996-12-01" @default.
• W1982687194 modified "2023-09-28" @default.
• W1982687194 title "Structure and morphology of MgO/YBCO bilayers for biepitaxial junctions" @default.
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• W1982687194 doi "https://doi.org/10.1016/s0921-4534(96)00599-0" @default.
• W1982687194 hasPublicationYear "1996" @default.
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