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- W1982963485 abstract "It has been known for some time that ionizing radiation has profound effects on integrated circuits. These need to be considered when such devices may be subjected to radiation environments, such as in the space and nuclear industries. As even the space industry is making increased use of commercial off-the-shelf components for cost considerations, it is again becoming more important to characterize the degradation profiles of ICs which have not necessarily been radiation hardened. To that effect, the performance characteristics as functions of total dose have been analyzed for Motorola MC14050B CMOS Hex buffers in order to identify some relevant parameters. This paper presents the static (dc) and dynamic (ac) characteristics of these devices which have been subjected to increasing total doses under different bias conditions." @default.
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- W1982963485 date "1998-12-01" @default.
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- W1982963485 title "Static and dynamic performance degradation of CMOS buffers due to ionizing radiation" @default.
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- W1982963485 doi "https://doi.org/10.1016/s0026-2692(97)00099-2" @default.
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