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• W1983156928 abstract "Self-heating effects in AlGaN/GaN high-electron mobility transistors grown on three different substrates have been evaluated for ambient temperatures between 0 <sup xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>°</sup> C and 225 <sup xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>°</sup> C. A simple and accurate electrical method for the estimation of channel temperature is proposed. This technique is based on the difference in drain current between dc and short-pulsed conditions. Being an electrical method, neither special geometry nor expensive equipments are required. Simulations have also been performed to confirm the results. We have applied our technique to different device structures and geometries, demonstrating its sensitivity and validity at different ambient temperatures." @default.
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• W1983156928 date "2013-12-01" @default.
• W1983156928 modified "2023-09-30" @default.
• W1983156928 title "Simple and Accurate Method to Estimate Channel Temperature and Thermal Resistance in AlGaN/GaN HEMTs" @default.
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• W1983156928 doi "https://doi.org/10.1109/ted.2013.2284851" @default.
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