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• W1984103313 abstract "This work describes a new computational approach for modeling the radiation-induced transient current and charge collection at circuit-level. Our methodology is based on a random-walk process that takes into account both diffusion and drift of radiation-induced minority carriers in a non-constant electric field both in space and time. The model has been successfully coupled either with an internal routine or with SPICE for circuit solving and feedback on the charge-collection process. It is illustrated here for a junction impacted by an ionizing particle and embedded in a CMOS inverter." @default.
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• W1984103313 date "2014-09-01" @default.
• W1984103313 modified "2023-10-18" @default.
• W1984103313 title "Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits" @default.
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• W1984103313 doi "https://doi.org/10.1016/j.microrel.2014.07.088" @default.
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