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- W1985993967 abstract "Nanopores have garnered much scientific interest due for their applications in modeling biological systems and as use for biosensors. Their size creates a system in which transported ions must interact with the pore walls. These nanoscale effects have led to the devolvement of ion controlling devices such as diodes and transistors with a broad range of applications. Past studies of ionic diodes have mainly focused on lateral dimension dependencies on rectification while keeping the length in the micrometer range. The ability to shorten nanopore diodes while retaining their rectification abilities has important applications to the production of ionic circuits, artificial cells, and lab-on-a-chip systems. We look at the rectification abilities of 30 nm long nanopores drilled by the transmission electron microscope (TEM) into a Silicon Nitride membrane between ±1V at 10 mM, 100 mM, and 1 M KCl. We perform current-voltage (I-V) measurements on single nanopores in 3 states: as-prepared by TEM, one side evaporated with 8 nm thick layer of gold, and after modifying the gold layer with thiols. In the two modified states, the pores show rectification at all concentrations. The rectification direction indicates that the pores rectify as if conical rather than cylindrical indicating the double conical nature of TEM drilled nanopores plays a significant role at the nanometer scale. Additionally, with only gold, the rectification and current magnitudes are enhanced due to nonlinear kinetic flow near one of the pore openings. The recorded current-voltage curves exhibit three regimes with ohmic, limiting and overlimiting currents, previously observed in nanofluidic large-aspect ratio channels. Rectification in nanometer long pores would be of significant importance to the future development and miniaturization of ionic nanoscale systems." @default.
- W1985993967 created "2016-06-24" @default.
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- W1985993967 date "2015-01-01" @default.
- W1985993967 modified "2023-09-27" @default.
- W1985993967 title "Rectification Properties of Low Aspect Ratio TEM Drilled Nanopores" @default.
- W1985993967 doi "https://doi.org/10.1016/j.bpj.2014.11.947" @default.
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