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• W1986666858 abstract "Understanding the elastic and plastic deformation properties of nanostructured metals requires the development of in situ testing methods that can follow the footprints of the deformation mechanism(s) during mechanical testing. Here we present an in situ synchrotron x-ray-diffraction technique which allows the measurement of diffraction profiles continuously during mechanical testing, providing an in situ peak profile analysis capability. The in situ approach is achieved thanks to the development of a microstrip detector allowing the instantaneous measurement of the diffraction pattern over a 2θ range of 60°. This in situ technique allows for the first time a comparison of the footprints of the plastic deformation mechanism during loading and after unloading. The measurements are performed on several types of freestanding dog bones, covering sample thicknesses down to the submicron range." @default.
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• W1986666858 date "2006-01-01" @default.
• W1986666858 modified "2023-09-24" @default.
• W1986666858 title "Following peak profiles during elastic and plastic deformation: A synchrotron-based technique" @default.
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• W1986666858 doi "https://doi.org/10.1063/1.2162453" @default.
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