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- W1986782078 abstract "The relaxation fields around regular {211} cracks in LPE garnet films are studied by means of the X-ray double-crystal topography. The dependence of Δa/a⟂ on distance from the crack is deter-mined for the film as well as for the substrate. The relaxation fields differ for the samples with different misfit.Die Relaxationsfelder um die regelmasigen {211} Risse in LPE-Granatschichten werden mit Hilfe einer Rontgen-Doppelkristalltopographie studiert. Die Abhangigkeit Δa/a⟂ fur den Ab-stand von einem Ris wird fur den Film und auch fur das Substrat festgestellt. Die Relaxations-felder unterscheiden sich bei Schichten mit verschiedenen Fehlanpassungen." @default.
- W1986782078 created "2016-06-24" @default.
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- W1986782078 date "1986-07-16" @default.
- W1986782078 modified "2023-09-25" @default.
- W1986782078 title "A Study of the Lattice Relaxation around Cracks in LPE Garnet Films" @default.
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- W1986782078 doi "https://doi.org/10.1002/pssa.2210960129" @default.
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