FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W1986818158> ?p ?o ?g. }

• W1986818158 endingPage "2010" @default.
• W1986818158 startingPage "2008" @default.
• W1986818158 abstract "Thermally stimulated current- and capacitance-voltage techniques are combined to provide the first quantitative estimates of the contributions of trapped-hole annealing and electron trapping to oxide-trap charge neutralization in metal-oxide-semiconductor devices. For 350-nm nonradiation-hardened oxides, trapped electrons compensate ∼15% of the radiation-induced trapped positive charge after x-ray irradiation (evidently forming dipolar defects), and ∼65% of the trapped positive charge remaining after positive-bias annealing at 80 °C. For 45-nm radiation-hardened oxides, trapped electrons compensate ∼45% of the trapped positive charge after irradiation, and ∼70% after annealing. Implications for models of oxide-trap-charge buildup and annealing are discussed." @default.
• W1986818158 created "2016-06-24" @default.
• W1986818158 creator A5024133729 @default.
• W1986818158 creator A5037838488 @default.
• W1986818158 creator A5049822123 @default.
• W1986818158 date "1992-04-20" @default.
• W1986818158 modified "2023-10-16" @default.
• W1986818158 title "Trapped-hole annealing and electron trapping in metal-oxide-semiconductor devices" @default.
• W1986818158 cites W1970029119 @default.
• W1986818158 cites W1972289215 @default.
• W1986818158 cites W1996568067 @default.
• W1986818158 cites W2001063008 @default.
• W1986818158 cites W2007661130 @default.
• W1986818158 cites W2012364451 @default.
• W1986818158 cites W2017815183 @default.
• W1986818158 cites W2020757516 @default.
• W1986818158 cites W2025798900 @default.
• W1986818158 cites W2029707735 @default.
• W1986818158 cites W2037671463 @default.
• W1986818158 cites W2038829215 @default.
• W1986818158 cites W2051400932 @default.
• W1986818158 cites W2070365547 @default.
• W1986818158 cites W2075951787 @default.
• W1986818158 cites W2078713657 @default.
• W1986818158 cites W2081981946 @default.
• W1986818158 cites W2086999274 @default.
• W1986818158 cites W2087450899 @default.
• W1986818158 cites W2089370592 @default.
• W1986818158 cites W2128171250 @default.
• W1986818158 cites W2160319990 @default.
• W1986818158 cites W2315486638 @default.
• W1986818158 doi "https://doi.org/10.1063/1.107126" @default.
• W1986818158 hasPublicationYear "1992" @default.
• W1986818158 type Work @default.
• W1986818158 sameAs 1986818158 @default.
• W1986818158 citedByCount "34" @default.
• W1986818158 countsByYear W19868181582016 @default.
• W1986818158 countsByYear W19868181582019 @default.
• W1986818158 crossrefType "journal-article" @default.
• W1986818158 hasAuthorship W1986818158A5024133729 @default.
• W1986818158 hasAuthorship W1986818158A5037838488 @default.
• W1986818158 hasAuthorship W1986818158A5049822123 @default.
• W1986818158 hasConcept C108225325 @default.
• W1986818158 hasConcept C111337013 @default.
• W1986818158 hasConcept C113196181 @default.
• W1986818158 hasConcept C120665830 @default.
• W1986818158 hasConcept C121332964 @default.
• W1986818158 hasConcept C143873397 @default.
• W1986818158 hasConcept C147120987 @default.
• W1986818158 hasConcept C147789679 @default.
• W1986818158 hasConcept C153385146 @default.
• W1986818158 hasConcept C173523689 @default.
• W1986818158 hasConcept C17525397 @default.
• W1986818158 hasConcept C178790620 @default.
• W1986818158 hasConcept C184779094 @default.
• W1986818158 hasConcept C185544564 @default.
• W1986818158 hasConcept C185592680 @default.
• W1986818158 hasConcept C18903297 @default.
• W1986818158 hasConcept C191897082 @default.
• W1986818158 hasConcept C192562407 @default.
• W1986818158 hasConcept C2777855556 @default.
• W1986818158 hasConcept C2777924906 @default.
• W1986818158 hasConcept C2779851234 @default.
• W1986818158 hasConcept C30066665 @default.
• W1986818158 hasConcept C41999313 @default.
• W1986818158 hasConcept C43617362 @default.
• W1986818158 hasConcept C49040817 @default.
• W1986818158 hasConcept C544153396 @default.
• W1986818158 hasConcept C62520636 @default.
• W1986818158 hasConcept C86803240 @default.
• W1986818158 hasConceptScore W1986818158C108225325 @default.
• W1986818158 hasConceptScore W1986818158C111337013 @default.
• W1986818158 hasConceptScore W1986818158C113196181 @default.
• W1986818158 hasConceptScore W1986818158C120665830 @default.
• W1986818158 hasConceptScore W1986818158C121332964 @default.
• W1986818158 hasConceptScore W1986818158C143873397 @default.
• W1986818158 hasConceptScore W1986818158C147120987 @default.
• W1986818158 hasConceptScore W1986818158C147789679 @default.
• W1986818158 hasConceptScore W1986818158C153385146 @default.
• W1986818158 hasConceptScore W1986818158C173523689 @default.
• W1986818158 hasConceptScore W1986818158C17525397 @default.
• W1986818158 hasConceptScore W1986818158C178790620 @default.
• W1986818158 hasConceptScore W1986818158C184779094 @default.
• W1986818158 hasConceptScore W1986818158C185544564 @default.
• W1986818158 hasConceptScore W1986818158C185592680 @default.
• W1986818158 hasConceptScore W1986818158C18903297 @default.
• W1986818158 hasConceptScore W1986818158C191897082 @default.
• W1986818158 hasConceptScore W1986818158C192562407 @default.
• W1986818158 hasConceptScore W1986818158C2777855556 @default.
• W1986818158 hasConceptScore W1986818158C2777924906 @default.
• W1986818158 hasConceptScore W1986818158C2779851234 @default.
• W1986818158 hasConceptScore W1986818158C30066665 @default.
• W1986818158 hasConceptScore W1986818158C41999313 @default.
• W1986818158 hasConceptScore W1986818158C43617362 @default.
• W1986818158 hasConceptScore W1986818158C49040817 @default.
• W1986818158 hasConceptScore W1986818158C544153396 @default.
• W1986818158 hasConceptScore W1986818158C62520636 @default.
• W1986818158 hasConceptScore W1986818158C86803240 @default.

• next