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• W1987766672 abstract "The secondary electron emission induced by electron and ion impact on the grid and collector of ionization gauges has been studied. This electron emission contributes about 10–20% to the sensitivity of the gauge. Changes in the chemical composition of the electrode surfaces result in changes of the secondary electron yield and thus in changes of the gauge sensitivity. It is shown that sensitivity changes of at most a few per cent are to be expected from these surface changes." @default.
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• W1987766672 date "1988-01-01" @default.
• W1987766672 modified "2023-10-17" @default.
• W1987766672 title "Surface effects on the stability of hot cathode ionization gauges" @default.
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• W1987766672 doi "https://doi.org/10.1016/0042-207x(88)90173-x" @default.
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