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• W1989164059 abstract "Abstract Physical mechanisms involved in insulators submitted to electron irradiation inside a scanning electron microscope (SEM) are investigated by combining some simple considerations of electron trapping mechanisms with basic equation of electrostatics. To understand such mechanisms, only widely irradiated samples having a uniform trapping sites distribution are considered. This hypothesis leads to develop simple models for the trapped charge distributions and subsequently for the distribution of the electric field build-up in ground coated specimens as investigated in electron probe microanalysis (EPMA). This enables us to study the distortion of the Φ ( ρz ) function (the depth distribution of characteristic X-ray production) as well as the modification of the specimen’s local composition. In this paper, an experimental method, using a series of quartz samples, is described for evaluating the magnitude of the electric field build-up within specimens; thus allowing to establish clearly the electric field influence on the measured Φ ( ρz ) function." @default.
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• W1989164059 date "2005-10-01" @default.
• W1989164059 modified "2023-10-18" @default.
• W1989164059 title "Measurement of internal electric field in coated grounded quartz irradiated by an electron beam" @default.
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• W1989164059 doi "https://doi.org/10.1016/j.nimb.2005.05.046" @default.
• W1989164059 hasPublicationYear "2005" @default.
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