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- W1989471818 abstract "We discuss very briefly how electronic, especially digital, techniques, could help flaw detection in three areas: cueing, automatic detection, and internal flaw detection.© (1975) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only." @default.
- W1989471818 created "2016-06-24" @default.
- W1989471818 creator A5008831111 @default.
- W1989471818 date "1975-10-20" @default.
- W1989471818 modified "2023-10-05" @default.
- W1989471818 title "<title>Electronic Processing In Flaw Detection</title>" @default.
- W1989471818 doi "https://doi.org/10.1117/12.954381" @default.
- W1989471818 hasPublicationYear "1975" @default.
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