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- W1989684449 abstract "We demonstrate high-geometrical-resolution imaging of dislocations in 4H-SiC by monochromatic synchrotron topography (but still under the “integrated wave” condition). In back-reflection topographs, 1c screw dislocation images are “magnified” to appear as well-defined circular white spots, while basal plane dislocations with opposite edge Burgers vector components exhibit two distinct kinds of contrast features. All the dislocation images are precisely described by ray-tracing simulations. This imaging technique provides an accurate, comprehensive, and nondestructive characterization tool, which is needed by current SiC researchers is used for industrial applications. It also provides a simple picture for understanding the mechanisms underlying synchrotron diffraction imaging of defects." @default.
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- W1989684449 date "2007-12-03" @default.
- W1989684449 modified "2023-09-26" @default.
- W1989684449 title "High-geometrical-resolution imaging of dislocations in SiC using monochromatic synchrotron topography" @default.
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- W1989684449 doi "https://doi.org/10.1063/1.2814032" @default.
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