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- W1990122532 abstract "The morphology of the solid-liquid interface and the metal phase grain diameter of Al—Si-type eutectics (Al—Si, Ag—Si, Ag—Ge, Zn—Ge) were investigated in the range of a growth rate R = 0.2 … 20 mm/h and of a temperature gradient at the solid-liquid interface G = 2 … 25 K/mm. Three types of interfacial morphologies depending on the G/R ratios were found out. The G/R ratio of the transition from a planar to a nonplanar solid-liquid interface corresponds to the critical G/R|c ratio, which can be calculated by the criterion of the constitutional undercooling. The grain diameter of the metal phase depends on growth parameters as follows: dK ∼ R—rG—g with r = 0.33 … 0.43 and g = −0.37 … 0.03. Die Morphologie der Grenzfläche fest-flüssig und der Korndurchmesser der Metallphase von Eutektika des Typs Al—Si (Al—Si, Ag—Si, Ag—Ge, Zn—Ge) wurden im Bereich der Wachstumsraten R = 0.2 … 20 mm/h und Temperaturgradienten an der Grenzfläche fest-flüssig G = 2 … 25 K/mm untersucht. Drei Typen der Grenzflächenmorphologien konnten in Abhängigkeit von dem G/R-Verhältnis gefunden werden. Das G/R-Verhältnis, bei dem der Übergang von einer planaren zu einer nichtplanaren Grenzfläche fest-flüssig erfolgt, entspricht dem kritischen G/R|c-Verhältnis für die Stabilität der Grenzfläche fest-flüssig, das mit dem Kriterium der konstitutionellen Unterkühlung berechenbar ist. Der Korndurchmesser der Metallphase ist eine Funktion der Wachstumsparameter der Form dK ∼ R—rG—g, wober r = 0,33 … 0,43 und g = −0,37 … 0,03 ist." @default.
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- W1990122532 date "1985-09-01" @default.
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- W1990122532 title "Interfacial stability and grain diameter of the metal phase of directionally solidified Al-Si-type eutectics" @default.
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- W1990122532 doi "https://doi.org/10.1002/crat.2170200924" @default.
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