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• W1990404146 abstract "We have measured the temperature dependence of the penetration depth, λ(T), down to 6.7 K in a YBCO single crystal using a homemade, frequency-modulated magnetic force microscope. It employs a piezo-resistive cantilever oscillating at its resonant frequency with a magnetic tip located on the free end. The magnetic field generated from the tip induces a shielding current in the sample that in turn interacts with the magnetic tip (magnetic levitation force). We first measured the force gradient (by measuring the change in cantilever's effective resonant frequency) between the tip and the sample as a function of their separation, a: F′=F′(a,T) at different temperatures. A model in which λ(T) is an adjustable parameter is then exploited to fit the data. The λ(T) thus obtained grows with T in terms of λ(0)(1+T2/Tc2) for T/Tc⩽0.786 and λ(0)/(1−T2/Tc2)1/2 for T/Tc⩾0.786, which is in good agreement with macroscopic measurements." @default.
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• W1990404146 date "2002-06-01" @default.
• W1990404146 modified "2023-09-29" @default.
• W1990404146 title "Localized measurement of penetration depth for a high Tc superconductor single crystal using a magnetic force microscope" @default.
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• W1990404146 doi "https://doi.org/10.1016/s0921-4534(01)01067-x" @default.
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