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• W1990606427 abstract "We have applied secondary ion mass spectroscopy to study the interdiffusions between Tl2Ba2CaCu2O8 single crystal films and five single crystal oxide substrates, and also correlated these results to their microwave device performances. These superconducting films were grown on LaAlO3, MgO, NdGaO3, CaNdAlO4, and SrTiO3 10 × 10 mm substrates by a two step method: predeposition of amorphous layer by laser ablation followed by high temperature thermal annealing. No interdiffusion was observed in films grown on LaAlO3 or MgO. The films on LaAlO3 exhibited both the best transport properties and the best microwave performance in the microstrip resonator test structure. The microwave properties of films on MgO were much degraded by the poor epitaxy between Tl2Ba2CaCu2O8 and MgO. Films grown on NdGaO3 and CaNdAlO4 showed significant interdiffusion at the standard annealing temperature (850°C). These interdiffusions were reduced by lowering the annealing temperature to 800°C, but the microwave device performances were still suppressed by some minor interdiffusion. Interdiffusion of Sr into the Tl2Ba2CaCu2O8 films grown on SrTiO3 substrates was observed, but the resulting superconducting properties and microwave performance were not affected." @default.
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• W1990606427 date "1992-01-01" @default.
• W1990606427 modified "2023-09-27" @default.
• W1990606427 title "Substrate interdiffusion in Tl2Ba2CaCu2O8 thin films and its effects on microwave device performance" @default.
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• W1990606427 doi "https://doi.org/10.1016/0169-4332(92)90298-c" @default.
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