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- W1990684864 abstract "Abstract The high sensitivity and spatial resolution of the atomic force microscope make it a powerful tool for measuring local properties of mesoscopic systems. We consider its application to mapping voltage distributions in two cases: a narrow constriction in a two-dimensional electron gas, and a current-carrying quantum Hall conductor. We demonstrate the ability to measure these distributions with sub-micron resolution and sub-millivolt precision." @default.
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- W1990684864 date "1998-06-01" @default.
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- W1990684864 title "Scanned potential microscopy of a two-dimensional electron gas" @default.
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- W1990684864 doi "https://doi.org/10.1016/s0921-4526(98)00071-4" @default.
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