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• W1991434963 abstract "The 1/f noise in individual semiconducting carbon nanotubes (s-CNT) in a field effect transistor configuration has been measured in ultra-high vacuum and following exposure to air. The amplitude of the normalized current spectral noise density is independent of source-drain current, indicating the noise is due to mobility rather than number fluctuations. Hooge's constant for s-CNT is found to be 9.3 plus minus 0.4x10^-3. The magnitude of the 1/f noise is substantially degreased by exposing the devices to air." @default.
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• W1991434963 date "2006-05-15" @default.
• W1991434963 modified "2023-09-27" @default.
• W1991434963 title "Hooge’s constant for carbon nanotube field effect transistors" @default.
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• W1991434963 doi "https://doi.org/10.1063/1.2206685" @default.
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