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• W1991452534 abstract "We present here our work on nanoscale wear induced by the tip of an atomic force microscope on thin polystyrene films. Under a wide range of conditions, the repeated scanning of the polymer surface leads to the formation of tip-induced wear patterns consisting of ridges oriented perpendicular to the scanning directions. We found that the evolution of the root mean squared roughness follows an exponential saturation law. Tip-induced wear was more extensive at higher applied loads where transition from rippling to rupturing wear was also observed. Analysis of the patterns formed suggests a crazing mechanism for the observed plastic deformation. The degree of wear as well as the type of the patterns formed was found to depend strongly on the density of the scan lines. In particular an overlap between successive scan lines is necessary to obtain a periodic pattern." @default.
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• W1991452534 date "2005-05-20" @default.
• W1991452534 modified "2023-10-10" @default.
• W1991452534 title "The initial stages of the wearing process of thin polystyrene films studied by atomic force microscopy" @default.
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• W1991452534 doi "https://doi.org/10.1088/0957-4484/16/8/040" @default.
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