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- W1992175038 abstract "Electronic devices based on III-V compounds can be significantly affected in their behaviour by surface and interface properties. This paper will show the usefulness of surface and interface analytical tools such as SIMS, SAES and XPS in overcoming such problems. Case studies in relation with some of the main problems of III-V compounds technologies will be described." @default.
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- W1992175038 date "1986-07-01" @default.
- W1992175038 modified "2023-10-10" @default.
- W1992175038 title "Applications of SIMS, SAES and XPS to problems in the semiconductor industry" @default.
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- W1992175038 doi "https://doi.org/10.1002/sia.740090504" @default.
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