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- W1992387908 abstract "It is believed that resistive open faults can cause small delay defects at wires, contacts, and/or vias of a circuit. However, it remains to be elucidated whether any methods could diagnose resistive open faults. We propose a method for diagnosing resistive open faults by using a diagnostic delay fault simulation with the minimum detectable delay fault size. We also introduce a fault excitation function for the resistive open fault to improve the accuracy of the diagnostic result. The fault excitation function for the resistive open fault can determine a size of an additional delay at a faulty line with considering the effect of the adjacent lines. We demonstrated that the proposed method is capable of identifying fault locations for the resistive open fault with a small computation cost." @default.
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- W1992387908 date "2010-10-01" @default.
- W1992387908 modified "2023-09-25" @default.
- W1992387908 title "A method for diagnosing resistive open faults with considering adjacent lines" @default.
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- W1992387908 doi "https://doi.org/10.1109/iscit.2010.5665061" @default.
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