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- W1992658396 abstract "ZnO thin-films were deposited by spray pyrolysis and RF magnetron sputtering techniques. The optical reflection of these thin-films is measured using UV-Vis spectrophotometer. The measured optical reflection data is used in PC-1D simulation software to study the output performance of commercial silicon wafer-based solar cell. As far as optical performance is concerned it could be demonstrated that the sprayed ZnO thin-film under laboratory conditions show equivalent performance compared to sputtered ZnO thin-film. The influence of optical properties of 65 nm thick zinc oxide thin-films deposited by vacuum and non-vacuum techniques on quantum efficiency and IV characteristics of commercial silicon-wafer based solar cell is studied and reported here." @default.
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- W1992658396 date "2013-05-24" @default.
- W1992658396 modified "2023-09-24" @default.
- W1992658396 title "Influence of optical properties of ZnO thin-films deposited by spray pyrolysis and RF magnetron sputtering on the output performance of silicon solar cell" @default.
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- W1992658396 doi "https://doi.org/10.1088/1757-899x/43/1/012002" @default.
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