Matches in SemOpenAlex for { <https://semopenalex.org/work/W1993094555> ?p ?o ?g. }
Showing items 1 to 86 of
86
with 100 items per page.
- W1993094555 endingPage "1774" @default.
- W1993094555 startingPage "1774" @default.
- W1993094555 abstract "In this study, nanocrystalline CoFeCu thin films were electrodeposited at different current densities from baths with natural pH (around 5.2) and containing 20 g/L citrate sodium. The relationship of films structure with soft magnetic properties and electrical resistivity, which are required for new generation magnetic head core, were investigated. SEM, EDS, XRD, TEM, VSM and four probe-point methods were used for characterization of the deposited films. The deposited films exhibited very uniform and homogenous structure with co-axis grains (confirmed by (111) and (110) poles figures and TEM images) throughout the coating. Overall, it was noticed that increasing current density from 1 to 24 mA/cm2 reduced both grain size (from 63 to 8 nm) and coercivity (from 20 to 1 Oe) of the films. In addition, plotting Log (Hc) versus Log (D6) demonstrated that the coercivity of the films followed “D6 law”. Moreover, increasing current density changed phase structures of the films from FCC (Cu)+FCC (Co) to FCC (Co) and then to FCC (Co)+BCC (Fe). The double phase films exhibited the lowest coercivity in comparison with single phase films due to their finer grain size. However, grain size had no effect on saturation magnetization of the films. An increase in current density up to 10 mA/cm2 also caused the substitution of diamagnetic copper with cobalt and iron in the deposit which led to reduction in saturation magnetization. Increasing current density also led to increasing grain boundaries in the deposits and hence, according to “scattering hypotheses”, enhanced the electrical resistivities." @default.
- W1993094555 created "2016-06-24" @default.
- W1993094555 creator A5003264331 @default.
- W1993094555 creator A5021322089 @default.
- W1993094555 creator A5028909251 @default.
- W1993094555 creator A5072792658 @default.
- W1993094555 date "2012-02-28" @default.
- W1993094555 modified "2023-09-26" @default.
- W1993094555 title "Erratum to: Studies of electrical resistivity and magnetic properties of nanocrystalline CoFeCu thin films electrodeposited from citrate-added baths" @default.
- W1993094555 cites W154369422 @default.
- W1993094555 cites W1551184493 @default.
- W1993094555 cites W1649895848 @default.
- W1993094555 cites W1972342376 @default.
- W1993094555 cites W1977086027 @default.
- W1993094555 cites W1992612753 @default.
- W1993094555 cites W2001005812 @default.
- W1993094555 cites W2001580606 @default.
- W1993094555 cites W2018056289 @default.
- W1993094555 cites W2018889202 @default.
- W1993094555 cites W2021999509 @default.
- W1993094555 cites W2022990235 @default.
- W1993094555 cites W2028258309 @default.
- W1993094555 cites W2028852114 @default.
- W1993094555 cites W2029591440 @default.
- W1993094555 cites W2043001688 @default.
- W1993094555 cites W2053189266 @default.
- W1993094555 cites W2055065097 @default.
- W1993094555 cites W2063009977 @default.
- W1993094555 cites W2070147006 @default.
- W1993094555 cites W2073085106 @default.
- W1993094555 cites W2073661830 @default.
- W1993094555 cites W2092548469 @default.
- W1993094555 cites W2112772854 @default.
- W1993094555 cites W2118539261 @default.
- W1993094555 cites W2119008161 @default.
- W1993094555 cites W2140221506 @default.
- W1993094555 cites W2145020434 @default.
- W1993094555 cites W583593539 @default.
- W1993094555 doi "https://doi.org/10.1007/s10854-012-0650-8" @default.
- W1993094555 hasPublicationYear "2012" @default.
- W1993094555 type Work @default.
- W1993094555 sameAs 1993094555 @default.
- W1993094555 citedByCount "0" @default.
- W1993094555 crossrefType "journal-article" @default.
- W1993094555 hasAuthorship W1993094555A5003264331 @default.
- W1993094555 hasAuthorship W1993094555A5021322089 @default.
- W1993094555 hasAuthorship W1993094555A5028909251 @default.
- W1993094555 hasAuthorship W1993094555A5072792658 @default.
- W1993094555 hasBestOaLocation W19930945551 @default.
- W1993094555 hasConcept C119599485 @default.
- W1993094555 hasConcept C127413603 @default.
- W1993094555 hasConcept C140676511 @default.
- W1993094555 hasConcept C171250308 @default.
- W1993094555 hasConcept C191897082 @default.
- W1993094555 hasConcept C192562407 @default.
- W1993094555 hasConcept C42360764 @default.
- W1993094555 hasConcept C69990965 @default.
- W1993094555 hasConceptScore W1993094555C119599485 @default.
- W1993094555 hasConceptScore W1993094555C127413603 @default.
- W1993094555 hasConceptScore W1993094555C140676511 @default.
- W1993094555 hasConceptScore W1993094555C171250308 @default.
- W1993094555 hasConceptScore W1993094555C191897082 @default.
- W1993094555 hasConceptScore W1993094555C192562407 @default.
- W1993094555 hasConceptScore W1993094555C42360764 @default.
- W1993094555 hasConceptScore W1993094555C69990965 @default.
- W1993094555 hasIssue "9" @default.
- W1993094555 hasLocation W19930945551 @default.
- W1993094555 hasOpenAccess W1993094555 @default.
- W1993094555 hasPrimaryLocation W19930945551 @default.
- W1993094555 hasRelatedWork W1968545275 @default.
- W1993094555 hasRelatedWork W1983193014 @default.
- W1993094555 hasRelatedWork W2007845734 @default.
- W1993094555 hasRelatedWork W2026511702 @default.
- W1993094555 hasRelatedWork W2049573112 @default.
- W1993094555 hasRelatedWork W2060138228 @default.
- W1993094555 hasRelatedWork W2322722469 @default.
- W1993094555 hasRelatedWork W2327683824 @default.
- W1993094555 hasRelatedWork W2391724951 @default.
- W1993094555 hasRelatedWork W2417268256 @default.
- W1993094555 hasVolume "23" @default.
- W1993094555 isParatext "false" @default.
- W1993094555 isRetracted "false" @default.
- W1993094555 magId "1993094555" @default.
- W1993094555 workType "erratum" @default.