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- W1993211036 abstract "The effects of fast-neutron radiation damage in narrow-base PNPN devices were measured and compared with a simple, one-dimensional theory for PNPN devices, based the work of Kuz'min. The limitations of a PNPN device in a radiation environment are primarily determined by the increased forward on voltage. A reasonably good fit of observed and calculated on voltages for a variety of PNPN's was obtained using a silicon lifetime damage constant of ?106 sec-N/cm2. Design considerations for radiation-resistant PNPN's are discussed, and devices capable of operating after exposure to more than 1015 neutrons/cm2 are described. PNPN's are shown to be superior to bipolar transistors as power switches in a radiation environment." @default.
- W1993211036 created "2016-06-24" @default.
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- W1993211036 date "1967-10-01" @default.
- W1993211036 modified "2023-09-25" @default.
- W1993211036 title "Permanent Radiation Damage Effects in Narrow-Base PNPN Devices" @default.
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- W1993211036 doi "https://doi.org/10.1109/tns.1967.4324758" @default.
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