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- W1993604823 abstract "Abstract It is well known that a semiconductor to metal transition may be induced in amorphous semiconductor-metal alloys by increasing the metal concentration above a critical limit. However, without a knowledge of the atomic scale structure of the alloy it is difficult to ascribe a mechanism to this process. Three alloy systems (a-Si 1−x Ni x H, a-Ge 1−x Au x and a-Si 1−x Sn x H) have been prepared as thin films by rf reactive co-sputtering over pertinent composition ranges. The micro-structure of these alloys has been investigated using EXAFS. Both a-Si 1−x Ni x H and a-Ge 1−x Au x appear to consist of two separate phases, regions of an amorphous NiSi alloy and a crystalline GeAu alloy being embedded in an amorphous matrix provided by a-Si and a-Ge, respectively. In contrast, however, Sn atoms are substituted randomly into the a-Si tetrahedral random network." @default.
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- W1993604823 date "1990-01-01" @default.
- W1993604823 modified "2023-09-25" @default.
- W1993604823 title "Structural studies of amorphous semiconductor-metal alloys" @default.
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- W1993604823 doi "https://doi.org/10.1016/0042-207x(90)93950-n" @default.
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