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• W1994337592 abstract "Abstract Ultrathin pentacene films resemble benchmark and model materials for organic field-effect transistors (OFETs). We employ scanning transmission X-ray microspectroscopy (STXM) and confocal Raman microspectroscopy as highly resolving probes to obtain insight into the correlation of morphology and charge transport in pentacene OFETs. By combining the operation-induced intensity increase in Raman-active bands with micromorphology, we are able to visualize charge-induced effects, in particular charge trapping in pentacene OFETs during operation. The high sensitivity and specificity of Raman microscopy allows to distinguish between orientation and charge-induced effects and thus to locate the trapped charges at grain boundaries." @default.
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• W1994337592 date "2014-02-01" @default.
• W1994337592 modified "2023-09-27" @default.
• W1994337592 title "Employing microspectroscopy to track charge trapping in operating pentacene OFETs" @default.
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• W1994337592 doi "https://doi.org/10.1016/j.orgel.2013.12.002" @default.
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