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• W1994944110 abstract "Abstract Transmission electron microscopy (TEM) and X-ray structural analysis were used to investigate the structural characteristics of polycrystalline nickel electrodeposits of different thicknesses and with a 〈211〉 texture. The results show unambiguously that (111) twinning planes perpendicular to the substrate and characteristic of the 〈211〉 orientation are observed even in very thin coatings (about 60 A thick) which can be examined by TEM. When the film thickness is gradually increased to 60 μm only the size of the crystallites, the dimensions of the coherent scattering regions and the twinning probability β are altered; the structure of the individual crystallites is unaffected. The defect planes were observed at all film thickness investigated. Comparison of the X-ray and TEM data suggests that the height of the coherent scattering regions and their dimensions perpendicular to the twinning planes are almost equal. Other types of twinning defects were observed along the (111) plane oblique to the substrate, and our studies have proved that these defects are rare and are not related to the initiation of 〈211〉-oriented crystallites. The final results of the investigations are in good agreement with the hypothesis that the 〈211〉 texture initiates as a result of the presence of paracrystalline clusters oriented parallel to the substrate which contain (111) twinning planes. Data which show that some additional factors may affect the formation of nickel polycrystalline coatings with this texture are also presented." @default.
• W1994944110 created "2016-06-24" @default.
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• W1994944110 date "1981-07-01" @default.
• W1994944110 modified "2023-09-25" @default.
• W1994944110 title "Electrocrystallization of nickel coatings with 〈211〉 texture" @default.
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• W1994944110 doi "https://doi.org/10.1016/0376-4583(81)90120-5" @default.
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