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• W1995085612 endingPage "1962" @default.
• W1995085612 startingPage "1956" @default.
• W1995085612 abstract "This paper presents a thorough numerical investigation of statistical effects associated with charge trapping dynamics and their impact on the reliability projection in decananometer MOSFETs. By means of a novel 3-D kinetic Monte Carlo TCAD reliability simulation technology, we track the time-dependent variability associated with granular charge injection and trapping into the oxide traps. We consider the interactions between the statistical variability of the virgin transistors, introduced by the discreteness of charge and granularity of matter, and the stochastic nature of the trap distribution and the trapping process itself. As a result, the path to device failure (PtDF), defined as the stochastic succession of trapping events that bring the device parameters to a predefined failure criteria, is analyzed in detail. In particular, we show that the two stochastic components determining the PtDF, namely the traps' capture time constants and threshold voltage shifts, are uncorrelated. The charge injection variability is shown to play a dominant role in determining the statistical dispersion of the reliability behavior. Furthermore, we show that the short- and long-term reliability behaviors are uncorrelated. Finally, 3-D fringing and percolative effects are shown to play an important role in determining the statistical degradation of nanoscale MOSFETs." @default.
• W1995085612 created "2016-06-24" @default.
• W1995085612 creator A5015212104 @default.
• W1995085612 creator A5016091223 @default.
• W1995085612 creator A5021962931 @default.
• W1995085612 creator A5052256878 @default.
• W1995085612 creator A5074530450 @default.
• W1995085612 date "2014-06-01" @default.
• W1995085612 modified "2023-09-23" @default.
• W1995085612 title "Time-Dependent 3-D Statistical KMC Simulation of Reliability in Nanoscale MOSFETs" @default.
• W1995085612 cites W1499580424 @default.
• W1995085612 cites W1965449330 @default.
• W1995085612 cites W1971011429 @default.
• W1995085612 cites W1972450251 @default.
• W1995085612 cites W1979243431 @default.
• W1995085612 cites W1982515552 @default.
• W1995085612 cites W1988922865 @default.
• W1995085612 cites W1991891926 @default.
• W1995085612 cites W1993007240 @default.
• W1995085612 cites W2015873112 @default.
• W1995085612 cites W2017480757 @default.
• W1995085612 cites W2035374584 @default.
• W1995085612 cites W2039623419 @default.
• W1995085612 cites W2040887205 @default.
• W1995085612 cites W2046976867 @default.
• W1995085612 cites W2052258608 @default.
• W1995085612 cites W2069118584 @default.
• W1995085612 cites W2098045174 @default.
• W1995085612 cites W2106482808 @default.
• W1995085612 cites W2128125131 @default.
• W1995085612 cites W2133225278 @default.
• W1995085612 cites W2134777311 @default.
• W1995085612 cites W2139145824 @default.
• W1995085612 cites W2141899849 @default.
• W1995085612 cites W2142947567 @default.
• W1995085612 cites W2144042557 @default.
• W1995085612 cites W2147024395 @default.
• W1995085612 cites W2148543725 @default.
• W1995085612 cites W2161648718 @default.
• W1995085612 cites W2172037169 @default.
• W1995085612 doi "https://doi.org/10.1109/ted.2014.2318172" @default.
• W1995085612 hasPublicationYear "2014" @default.
• W1995085612 type Work @default.
• W1995085612 sameAs 1995085612 @default.
• W1995085612 citedByCount "2" @default.
• W1995085612 countsByYear W19950856122015 @default.
• W1995085612 countsByYear W19950856122017 @default.
• W1995085612 crossrefType "journal-article" @default.
• W1995085612 hasAuthorship W1995085612A5015212104 @default.
• W1995085612 hasAuthorship W1995085612A5016091223 @default.
• W1995085612 hasAuthorship W1995085612A5021962931 @default.
• W1995085612 hasAuthorship W1995085612A5052256878 @default.
• W1995085612 hasAuthorship W1995085612A5074530450 @default.
• W1995085612 hasConcept C105795698 @default.
• W1995085612 hasConcept C111919701 @default.
• W1995085612 hasConcept C121332964 @default.
• W1995085612 hasConcept C121864883 @default.
• W1995085612 hasConcept C127413603 @default.
• W1995085612 hasConcept C163258240 @default.
• W1995085612 hasConcept C165801399 @default.
• W1995085612 hasConcept C172385210 @default.
• W1995085612 hasConcept C177774035 @default.
• W1995085612 hasConcept C18903297 @default.
• W1995085612 hasConcept C192562407 @default.
• W1995085612 hasConcept C19499675 @default.
• W1995085612 hasConcept C24326235 @default.
• W1995085612 hasConcept C2777924906 @default.
• W1995085612 hasConcept C2778413303 @default.
• W1995085612 hasConcept C33923547 @default.
• W1995085612 hasConcept C41008148 @default.
• W1995085612 hasConcept C43214815 @default.
• W1995085612 hasConcept C62520636 @default.
• W1995085612 hasConcept C8272713 @default.
• W1995085612 hasConcept C86803240 @default.
• W1995085612 hasConceptScore W1995085612C105795698 @default.
• W1995085612 hasConceptScore W1995085612C111919701 @default.
• W1995085612 hasConceptScore W1995085612C121332964 @default.
• W1995085612 hasConceptScore W1995085612C121864883 @default.
• W1995085612 hasConceptScore W1995085612C127413603 @default.
• W1995085612 hasConceptScore W1995085612C163258240 @default.
• W1995085612 hasConceptScore W1995085612C165801399 @default.
• W1995085612 hasConceptScore W1995085612C172385210 @default.
• W1995085612 hasConceptScore W1995085612C177774035 @default.
• W1995085612 hasConceptScore W1995085612C18903297 @default.
• W1995085612 hasConceptScore W1995085612C192562407 @default.
• W1995085612 hasConceptScore W1995085612C19499675 @default.
• W1995085612 hasConceptScore W1995085612C24326235 @default.
• W1995085612 hasConceptScore W1995085612C2777924906 @default.
• W1995085612 hasConceptScore W1995085612C2778413303 @default.
• W1995085612 hasConceptScore W1995085612C33923547 @default.
• W1995085612 hasConceptScore W1995085612C41008148 @default.
• W1995085612 hasConceptScore W1995085612C43214815 @default.
• W1995085612 hasConceptScore W1995085612C62520636 @default.
• W1995085612 hasConceptScore W1995085612C8272713 @default.
• W1995085612 hasConceptScore W1995085612C86803240 @default.
• W1995085612 hasIssue "6" @default.
• W1995085612 hasLocation W19950856121 @default.
• W1995085612 hasOpenAccess W1995085612 @default.

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