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Matches in SemOpenAlex for { <https://semopenalex.org/work/W1995141495> ?p ?o ?g. }

• W1995141495 endingPage "H875" @default.
• W1995141495 startingPage "H875" @default.
• W1995141495 abstract "The impact of back channel leakage (BCL) is thoroughly investigated when scaling down partially depleted (PD) silicon-on-insulator (SOI) devices. Back channel voltage is introduced as an indicator for monitoring the behavior of BCL. In addition to front-gate devices, back-gate devices also suffer from short channel effect. Finally, BCL can be successfully suppressed by optimizing process parameters such as the Si remains, the well implant, and the SOI thickness." @default.
• W1995141495 created "2016-06-24" @default.
• W1995141495 creator A5007533798 @default.
• W1995141495 creator A5014724368 @default.
• W1995141495 creator A5030464470 @default.
• W1995141495 creator A5035704572 @default.
• W1995141495 creator A5035815351 @default.
• W1995141495 creator A5036705162 @default.
• W1995141495 creator A5041921173 @default.
• W1995141495 creator A5048838065 @default.
• W1995141495 creator A5057411223 @default.
• W1995141495 creator A5071511791 @default.
• W1995141495 creator A5083299231 @default.
• W1995141495 creator A5091130424 @default.
• W1995141495 date "2010-01-01" @default.
• W1995141495 modified "2023-10-17" @default.
• W1995141495 title "Optimization of Back Channel Leakage Characteristic in PD SOI p-MOSFET" @default.
• W1995141495 cites W2060801129 @default.
• W1995141495 cites W2102191716 @default.
• W1995141495 cites W2109169998 @default.
• W1995141495 cites W2112723099 @default.
• W1995141495 cites W2128282513 @default.
• W1995141495 cites W2129145758 @default.
• W1995141495 cites W2144545882 @default.
• W1995141495 cites W2154869256 @default.
• W1995141495 cites W2156852806 @default.
• W1995141495 cites W2165677467 @default.
• W1995141495 cites W2166428371 @default.
• W1995141495 cites W2169467185 @default.
• W1995141495 cites W2172300097 @default.
• W1995141495 cites W2178806740 @default.
• W1995141495 doi "https://doi.org/10.1149/1.3459931" @default.
• W1995141495 hasPublicationYear "2010" @default.
• W1995141495 type Work @default.
• W1995141495 sameAs 1995141495 @default.
• W1995141495 citedByCount "3" @default.
• W1995141495 countsByYear W19951414952013 @default.
• W1995141495 countsByYear W19951414952020 @default.
• W1995141495 countsByYear W19951414952021 @default.
• W1995141495 crossrefType "journal-article" @default.
• W1995141495 hasAuthorship W1995141495A5007533798 @default.
• W1995141495 hasAuthorship W1995141495A5014724368 @default.
• W1995141495 hasAuthorship W1995141495A5030464470 @default.
• W1995141495 hasAuthorship W1995141495A5035704572 @default.
• W1995141495 hasAuthorship W1995141495A5035815351 @default.
• W1995141495 hasAuthorship W1995141495A5036705162 @default.
• W1995141495 hasAuthorship W1995141495A5041921173 @default.
• W1995141495 hasAuthorship W1995141495A5048838065 @default.
• W1995141495 hasAuthorship W1995141495A5057411223 @default.
• W1995141495 hasAuthorship W1995141495A5071511791 @default.
• W1995141495 hasAuthorship W1995141495A5083299231 @default.
• W1995141495 hasAuthorship W1995141495A5091130424 @default.
• W1995141495 hasConcept C119599485 @default.
• W1995141495 hasConcept C127162648 @default.
• W1995141495 hasConcept C127413603 @default.
• W1995141495 hasConcept C139719470 @default.
• W1995141495 hasConcept C162324750 @default.
• W1995141495 hasConcept C165801399 @default.
• W1995141495 hasConcept C172385210 @default.
• W1995141495 hasConcept C192562407 @default.
• W1995141495 hasConcept C195370968 @default.
• W1995141495 hasConcept C24326235 @default.
• W1995141495 hasConcept C2524010 @default.
• W1995141495 hasConcept C2777042071 @default.
• W1995141495 hasConcept C2778413303 @default.
• W1995141495 hasConcept C33556034 @default.
• W1995141495 hasConcept C33923547 @default.
• W1995141495 hasConcept C49040817 @default.
• W1995141495 hasConcept C53143962 @default.
• W1995141495 hasConcept C544956773 @default.
• W1995141495 hasConcept C99844830 @default.
• W1995141495 hasConceptScore W1995141495C119599485 @default.
• W1995141495 hasConceptScore W1995141495C127162648 @default.
• W1995141495 hasConceptScore W1995141495C127413603 @default.
• W1995141495 hasConceptScore W1995141495C139719470 @default.
• W1995141495 hasConceptScore W1995141495C162324750 @default.
• W1995141495 hasConceptScore W1995141495C165801399 @default.
• W1995141495 hasConceptScore W1995141495C172385210 @default.
• W1995141495 hasConceptScore W1995141495C192562407 @default.
• W1995141495 hasConceptScore W1995141495C195370968 @default.
• W1995141495 hasConceptScore W1995141495C24326235 @default.
• W1995141495 hasConceptScore W1995141495C2524010 @default.
• W1995141495 hasConceptScore W1995141495C2777042071 @default.
• W1995141495 hasConceptScore W1995141495C2778413303 @default.
• W1995141495 hasConceptScore W1995141495C33556034 @default.
• W1995141495 hasConceptScore W1995141495C33923547 @default.
• W1995141495 hasConceptScore W1995141495C49040817 @default.
• W1995141495 hasConceptScore W1995141495C53143962 @default.
• W1995141495 hasConceptScore W1995141495C544956773 @default.
• W1995141495 hasConceptScore W1995141495C99844830 @default.
• W1995141495 hasIssue "9" @default.
• W1995141495 hasLocation W19951414951 @default.
• W1995141495 hasOpenAccess W1995141495 @default.
• W1995141495 hasPrimaryLocation W19951414951 @default.
• W1995141495 hasRelatedWork W1973454880 @default.
• W1995141495 hasRelatedWork W2025921353 @default.
• W1995141495 hasRelatedWork W2033651357 @default.
• W1995141495 hasRelatedWork W2039829675 @default.

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