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- W1995384641 abstract "This paper deals with the on-site testing of GIS at high test frequencies generated by frequency tuned resonant test sets. The application of test frequencies of up to 300 Hz (see IEC 62271-203) showed no dependency on the breakdown voltage of the GIS insulation system. The publication also describes modern frequency tuned resonant test sets which enable efficient on-site testing. The return of experience from on-site testing of a state-of-the-art 245 kV GIS population is summarized" @default.
- W1995384641 created "2016-06-24" @default.
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- W1995384641 date "2006-06-01" @default.
- W1995384641 modified "2023-09-23" @default.
- W1995384641 title "High Voltage Testing of GIS: Application of Frequency Tuned Resonant Test Sets and Return of Experience from On-site Tests" @default.
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- W1995384641 doi "https://doi.org/10.1109/icpadm.2006.284175" @default.
- W1995384641 hasPublicationYear "2006" @default.
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