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• W1995548886 abstract "Structure and magnetic properties of FenCrnN ternary films prepared by DC magnetron facing-target sputtering have been investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), vibrating sample magnetometry (VSM) and Mössbauer effect. These films exhibit perpendicular magnetic anisotropy. We found that N2-to-Ar flow ratio, Fe-Cr target area ratio and substrate temperature during film preparation are the factors influencing the anisotropy. Adjusting the chemical composition and deposition parameters, we obtained saturation magnetization of 300–400 emu/cm3 and perpendicular coercivity of 800–1100 Oe. XRD measurements show that the films generally consist of the α-Fe(Cr) and γ′-(Fe,Cr)4Nx (x < 1) phases, and that the enhancement of perpendicular anisotropy is always accompanied by a decrease in the grain size of α-Fe(Cr) phase and growth of the γ′-(Fe,Cr)4Nx phase with a pronounced (2 0 0) texture. The Mössbauer spectra show that the γ′-(Fe,Cr)4Nx phase is nonmagnetic at room temperature. Using the SEM and TEM, we found that the nonmagnetic γ′-(Fe,Cr)4Nx phase displays columnar growth and that the small ferromagnetic α-Fe(Cr) grains of about 2–20 nm in diameter are located at grain boundaries of γ′-(Fe,Cr)4Nx grains. Shape anisotropy seems to play an important part in the perpendicular magnetic anisotropy in these FenCrnN films." @default.
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• W1995548886 date "1997-08-01" @default.
• W1995548886 modified "2023-10-11" @default.
• W1995548886 title "Structure and magnetic properties of FenCrnN sputter-deposited films" @default.
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• W1995548886 doi "https://doi.org/10.1016/s0304-8853(97)00122-4" @default.
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