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- W199556543 abstract "Scanning electron (SEM) and scanning transmission (STEM) electron microscopy are versatile, well established, techniques for characterisation of materials. Other papers in this volume attest to their widespread use for understanding semiconductors, and devices based on these various material combinations. This paper concentrates on studies performed in ultra-high vacuum (UHV), so that clean surfaces can be produced and maintained during the experiments. Under such conditions, several SEM and STEM signals have sensitivity at the monolayer (ML) level, so that true surface studies can be carried out." @default.
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- W199556543 title "Surface Studies by SEM and STEM" @default.
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- W199556543 doi "https://doi.org/10.1007/978-1-4613-0527-9_22" @default.
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