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- W1995916040 abstract "Low frequency noise measurements have been performed on a single-wall carbon nanotube connected by Ti/Au electrodes. It has been found that the 1/f noise decreases when the measurements are undertaken under vacuum and when the nanotube is partially degassed, showing a correlation between the fluctuation inducing the 1/f noise and the presence of gases. We show that the 1/f noise sources are located at the metal/nanotube contacts. When the device is annealed under vacuum at 450K, some Lorentzian shapes are observable and can be related to nanotube defects or to strongly bound molecules." @default.
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- W1995916040 date "2006-03-01" @default.
- W1995916040 modified "2023-09-25" @default.
- W1995916040 title "EXCESS LOW FREQUENCY NOISE IN SINGLE-WALL CARBON NANOTUBE" @default.
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- W1995916040 doi "https://doi.org/10.1142/s0219477506003136" @default.
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