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- W1996127145 abstract "Abstract The impact ionisation occurring under a high field in a semiconductor can be described in terms of the ionisation coefficient, the number of ionisation events directly produced by a carrier per unit length it travels. The position dependence of this impact ionisation coefficient is at present poorly understood, and is usually assumed to be constant, possibly with the inclusion of a deadspace length (where the coefficient is zero). It is more complicated in reality however as spatial oscillations can occur. In this paper we employ a Lucky drift model to give an explanation of the origin of spatial oscillations in the coefficients, and the way their features vary with a range of model parameters is investigated. In addition to constant fields, a piecewise linear/constant field is modelled, as is a quantum barrier placed in a region of constant fields. The results are specifically for GaAs, but have qualitative validity for the other wide bandgap III–V's. A realistic value for effective electron deadspace in GaAs is obtained, which is approx. 1.3 times the minimum deadspace." @default.
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- W1996127145 date "1995-02-01" @default.
- W1996127145 modified "2023-10-03" @default.
- W1996127145 title "Spatio-temporal impact ionisation transients: A Lucky drift model study in GaAs" @default.
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- W1996127145 doi "https://doi.org/10.1016/0038-1101(94)00102-l" @default.
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