Matches in SemOpenAlex for { <https://semopenalex.org/work/W1996189953> ?p ?o ?g. }
Showing items 1 to 88 of
88
with 100 items per page.
- W1996189953 endingPage "G652" @default.
- W1996189953 startingPage "G652" @default.
- W1996189953 abstract "High oxygen concentration in silicon increases the resistance of radiation detectors to high radiation doses. Unfortunately, high-resistivity float zone (FZ) silicon, needed for radiation detectors, has too low an oxygen content. The solution to this is silicon oxygenation. There are different ways of incorporating oxygen into silicon. The most accepted one is by high-temperature diffusion from a thick layer. In this paper, we investigate the impact of this silicon oxygenation technique as well as the application of different gettering techniques to improve the minority carrier lifetime of high-resistivity FZ silicon substrates for radiation detectors. The minority carrier lifetimes before and after surface etching have been measured on samples subjected to different oxygenation and gettering treatments by using a quasi steady-state photoconductance technique. A lifetime improvement efficiency factor is defined for each treatment process. The lifetime efficiency factors behave independently, so that the lifetime efficiency factors associated with different sequential combinations of treatments can be estimated by a multiplicative combination. Different gettering techniques that improve or degrade the minority carrier lifetime are analyzed, and the best options for silicon radiation detector fabrication are determined. Oxygenated silicon with a minority carrier lifetime close to 1 ms can be obtained. © 2004 The Electrochemical Society. All rights reserved." @default.
- W1996189953 created "2016-06-24" @default.
- W1996189953 creator A5017851776 @default.
- W1996189953 creator A5030553543 @default.
- W1996189953 creator A5034232955 @default.
- W1996189953 creator A5036529278 @default.
- W1996189953 creator A5043936121 @default.
- W1996189953 creator A5055281913 @default.
- W1996189953 creator A5065993753 @default.
- W1996189953 creator A5075657255 @default.
- W1996189953 creator A5078023241 @default.
- W1996189953 creator A5089712120 @default.
- W1996189953 date "2004-01-01" @default.
- W1996189953 modified "2023-10-14" @default.
- W1996189953 title "Effect of Combined Oxygenation and Gettering on Minority Carrier Lifetime in High-Resistivity FZ Silicon" @default.
- W1996189953 cites W1976344960 @default.
- W1996189953 cites W1982654852 @default.
- W1996189953 cites W1995718173 @default.
- W1996189953 cites W2005491559 @default.
- W1996189953 cites W2015012087 @default.
- W1996189953 cites W2034635508 @default.
- W1996189953 cites W2041102751 @default.
- W1996189953 cites W2058990682 @default.
- W1996189953 cites W2076302256 @default.
- W1996189953 cites W2079734824 @default.
- W1996189953 cites W2101781112 @default.
- W1996189953 cites W2152500129 @default.
- W1996189953 doi "https://doi.org/10.1149/1.1786091" @default.
- W1996189953 hasPublicationYear "2004" @default.
- W1996189953 type Work @default.
- W1996189953 sameAs 1996189953 @default.
- W1996189953 citedByCount "2" @default.
- W1996189953 crossrefType "journal-article" @default.
- W1996189953 hasAuthorship W1996189953A5017851776 @default.
- W1996189953 hasAuthorship W1996189953A5030553543 @default.
- W1996189953 hasAuthorship W1996189953A5034232955 @default.
- W1996189953 hasAuthorship W1996189953A5036529278 @default.
- W1996189953 hasAuthorship W1996189953A5043936121 @default.
- W1996189953 hasAuthorship W1996189953A5055281913 @default.
- W1996189953 hasAuthorship W1996189953A5065993753 @default.
- W1996189953 hasAuthorship W1996189953A5075657255 @default.
- W1996189953 hasAuthorship W1996189953A5078023241 @default.
- W1996189953 hasAuthorship W1996189953A5089712120 @default.
- W1996189953 hasConcept C100460472 @default.
- W1996189953 hasConcept C119599485 @default.
- W1996189953 hasConcept C125099081 @default.
- W1996189953 hasConcept C127413603 @default.
- W1996189953 hasConcept C160671074 @default.
- W1996189953 hasConcept C171250308 @default.
- W1996189953 hasConcept C192562407 @default.
- W1996189953 hasConcept C198865614 @default.
- W1996189953 hasConcept C2779227376 @default.
- W1996189953 hasConcept C49040817 @default.
- W1996189953 hasConcept C544956773 @default.
- W1996189953 hasConcept C69990965 @default.
- W1996189953 hasConceptScore W1996189953C100460472 @default.
- W1996189953 hasConceptScore W1996189953C119599485 @default.
- W1996189953 hasConceptScore W1996189953C125099081 @default.
- W1996189953 hasConceptScore W1996189953C127413603 @default.
- W1996189953 hasConceptScore W1996189953C160671074 @default.
- W1996189953 hasConceptScore W1996189953C171250308 @default.
- W1996189953 hasConceptScore W1996189953C192562407 @default.
- W1996189953 hasConceptScore W1996189953C198865614 @default.
- W1996189953 hasConceptScore W1996189953C2779227376 @default.
- W1996189953 hasConceptScore W1996189953C49040817 @default.
- W1996189953 hasConceptScore W1996189953C544956773 @default.
- W1996189953 hasConceptScore W1996189953C69990965 @default.
- W1996189953 hasIssue "10" @default.
- W1996189953 hasLocation W19961899531 @default.
- W1996189953 hasOpenAccess W1996189953 @default.
- W1996189953 hasPrimaryLocation W19961899531 @default.
- W1996189953 hasRelatedWork W1481584772 @default.
- W1996189953 hasRelatedWork W1663383707 @default.
- W1996189953 hasRelatedWork W1965248888 @default.
- W1996189953 hasRelatedWork W1998210601 @default.
- W1996189953 hasRelatedWork W2070194108 @default.
- W1996189953 hasRelatedWork W2214936313 @default.
- W1996189953 hasRelatedWork W2753046400 @default.
- W1996189953 hasRelatedWork W3135216591 @default.
- W1996189953 hasRelatedWork W2187481787 @default.
- W1996189953 hasRelatedWork W3162535340 @default.
- W1996189953 hasVolume "151" @default.
- W1996189953 isParatext "false" @default.
- W1996189953 isRetracted "false" @default.
- W1996189953 magId "1996189953" @default.
- W1996189953 workType "article" @default.