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- W1996337316 abstract "We review recent and main contributions to the extended fine structures observed in reflection mode electron energy-loss spectra. Those structures allow the local geometry determination of surfaces and interfaces like the well-known surface extended X-ray absorption fine structure technique (SEXAFS) usually performed with synchrotron facilities. The physical principles of the surface extended electron energy-loss fine structure (SEELFS) technique, its capabilities and limitations will be discussed. Several examples will be given and particular attention will be paid to the local order of clean surface, adsorbate monolayer on clean surface, initial stages of metal-semiconductor interface formation and metallic cluster growth on solid substrate. Furthermore, we obtain evidence of extended fine structures observed above core-valence-valence Auger transitions in Auger spectra of several materials. We tentatively suggest their underlying physical origins and analyse these oscillating structures following the same standard EXAFS formalism. The lattice parameters deduced from these extended fine Auger structures (EXFAS) are in good agreement with those deduced from synchrotron radiation EXAFS data, conferring therefore to the conventional Auger technique new capabilities as a surface sensitive local order probe." @default.
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- W1996337316 date "1987-10-01" @default.
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- W1996337316 title "Fine structure in electron energy-loss and auger spectra" @default.
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- W1996337316 doi "https://doi.org/10.1016/s0039-6028(87)80486-7" @default.
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