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- W1996650300 abstract "Four-port on-wafer de-embedding is necessary for on-wafer measurement at frequencies above 50 GHz. We found notable discrepancy between the Y-parameters de-embedded using different options provided by a recently published general four-port de-embedding algorithm to solve the four-port Y-parameter matrices. The problem is caused by the ideality assumptions on the internal THROUGH test structure. In this paper, we develop a further generalized algorithm that drops any ideality assumption except passivity on the THROUGH structure. The new method works for transistor S-parameters with or without Impedance Standard Substrate calibration." @default.
- W1996650300 created "2016-06-24" @default.
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- W1996650300 date "2010-01-01" @default.
- W1996650300 modified "2023-10-05" @default.
- W1996650300 title "Further generalized four-port de-embedding method by dropping ideality assumptions on the THROUGH structure" @default.
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- W1996650300 doi "https://doi.org/10.1109/smic.2010.5422976" @default.
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