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- W1998144433 abstract "The chemistry to manufacture high purity GeF{sub 4} and WF{sub 6} for use in the semiconductor industry using Starmet's new fluorine extraction technology has been developed. Production of GeF{sub 4} was established using a tube-style reactor system where conversion yields as high as 98.1% were attained for the reaction between and GeO{sub 2}. Collection of the fluoride gas improved to 97.7% when the reactor sweep gas contained a small fraction of dry air (10-12 vol%) along with helium. The lab-synthesized product was shown to contain the least amount of infrared active and elemental impurities when compared with a reference material certified at 99.99% purity. Analysis of the ''as-produced'' gas using ICP-MS showed that uranium could not be detected at a detection limit of 0.019ppm-wt. A process to make WF{sub 6} from WO{sub 2}, and UF{sub 4}, produced a WOF{sub 4} intermediate, which proved difficult to convert to tungsten hexafluoride using titanium fluoride as a fluorinating agent." @default.
- W1998144433 created "2016-06-24" @default.
- W1998144433 creator A5077099719 @default.
- W1998144433 date "2003-10-23" @default.
- W1998144433 modified "2023-10-10" @default.
- W1998144433 title "Production of High Value Fluorine Gases for the Semiconductor Industry" @default.
- W1998144433 doi "https://doi.org/10.2172/824744" @default.
- W1998144433 hasPublicationYear "2003" @default.
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