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• W1998227636 endingPage "510" @default.
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• W1998227636 abstract "Focused ion beam (FIB) milling is the typical method used to fabricate micropillars to study small-scale plasticity and size effects in uniaxial compression. However, FIB milling can introduce defects into the milled pillars. To investigate the effects of FIB damage on mechanical behavior, we tested Mo-alloy micropillars that were FIB milled following directional solidification, and compared their compressive response to pillars that were not FIB milled. We also FIB milled at glancing incidence a Mo-alloy single-crystal surface, and compared its nanoindentation response to an electropolished surface of the same crystal. Implications for the interpretation of data obtained from FIB-milled micropillars are discussed." @default.
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• W1998227636 date "2009-01-01" @default.
• W1998227636 modified "2023-10-16" @default.
• W1998227636 title "Effects of focused ion beam milling on the compressive behavior of directionally solidified micropillars and the nanoindentation response of an electropolished surface" @default.
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• W1998227636 doi "https://doi.org/10.1016/j.actamat.2008.09.033" @default.
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