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- W1998243405 abstract "A new method for real-time and simultaneous measuring the refractive index and thickness of thin films is proposed. The method is based on spectral dependence of phase-shifting on reflection at one of film's surface. The measurement consists in localizing pi-phase shift observed in a channel spectrum." @default.
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- W1998243405 date "2007-08-01" @default.
- W1998243405 modified "2023-09-25" @default.
- W1998243405 title "Spectral-domain interferometry for simultaneous measuring the refractive index and thickness" @default.
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- W1998243405 doi "https://doi.org/10.1109/cleopr.2007.4391285" @default.
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