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Matches in SemOpenAlex for { <https://semopenalex.org/work/W1998304449> ?p ?o ?g. }

• W1998304449 abstract "This paper presents results showing the robustness of different SiC JFET transistors from SiCED in current limitation regime or short-circuit operation. Crystal temperature during failure was estimated after different electrical characterizations and using appropriate models of saturation current which is used as a thermal indicator. This work shows the exceptional robustness of SiC JFET transistors in current limitation mode compared to Si devices (MOSFETS and IGBTs)." @default.
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• W1998304449 date "2009-09-01" @default.
• W1998304449 modified "2023-09-25" @default.
• W1998304449 title "Estimation of SiC JFET temperature during short-circuit operations" @default.
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• W1998304449 doi "https://doi.org/10.1016/j.microrel.2009.06.024" @default.
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