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• W1998358575 abstract "We present calculations of the tunneling conductivity through thin oxide layers grown on a metal substrate. The results, in agreement with experimental scanning-tunneling-microscopy spectroscopy data of Binnig et al. show how to obtain information on the electronic structure and electrical properties as well as on the number of oxide layers grown in the first stages of the oxidation. Our findings for NiO on Ni(100) are consistent with the local-density band-structure calculations of Terakura et al." @default.
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• W1998358575 date "1986-03-15" @default.
• W1998358575 modified "2023-10-16" @default.
• W1998358575 title "Conductivity and structure of thin oxide layers grown on a metal substrate: Scanning-tunneling microscopy in NiO on Ni(100)" @default.
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• W1998358575 doi "https://doi.org/10.1103/physrevb.33.4439" @default.
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