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• W1998819604 abstract "We have investigated periodic arrays of dry etched 150 nm and 175 nm wide, (110) oriented GaAs/AlAs quantum wires and quantum dots by means of reciprocal-space mapping using triple-axis X-ray diffractometry. From the X-ray data the lateral periodicity of wires and dots, the etch depth and the angle of misorientation of the wires with respect to the (110) direction are extracted. The reciprocal-space maps reveal that, after the fabrication process the lattice constant along the growth direction increases slightly for the wires and even more so for the dots." @default.
• W1998819604 created "2016-06-24" @default.
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• W1998819604 date "1995-04-14" @default.
• W1998819604 modified "2023-09-27" @default.
• W1998819604 title "Structural investigations of GaAs/AlAs quantum wires and quantum dots by X-ray reciprocal space mapping" @default.
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• W1998819604 doi "https://doi.org/10.1088/0022-3727/28/4a/038" @default.
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