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- W1999806435 abstract "We develop a novel approach for hot carrier lifetime prediction based on the ‘universality of HCI degradation’ that not only generalizes the classical theory by obviating the measurement of I B , but also allows prediction of HCI lifetime over a broad range of technology nodes, bias conditions, and device geometries. We explain the shape of the degradation vs. time characteristic based on the energy distribution of the Si-O bonds, and we show, based on the bond-dispersion model, that the degradation shows similar features for both ON- and OFF-state bias conditions." @default.
- W1999806435 created "2016-06-24" @default.
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- W1999806435 date "2010-01-01" @default.
- W1999806435 modified "2023-09-24" @default.
- W1999806435 title "A generalized, I<inf>B</inf>-independent, physical HCI lifetime projection methodology based on universality of hot-carrier degradation" @default.
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- W1999806435 doi "https://doi.org/10.1109/irps.2010.5488666" @default.
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