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- W2000170037 abstract "This paper deals with four different methods of LPE growth — the supercooling, step-cooling, equilibrium-cooling, and two-phase-solution techniques. The thickness of GaAs layers grown by each technique has been measured as a function of growth time. Except for layers grown by the two-phase-solution method, the data are in good agreement with simple theoretical equations derived here by assuming that the growth rate is determined by the rate of solute (As) diffusion toward the interface. The smoothest layers were obtained by the supercooling and step-cooling techniques, the roughest by the two-phase-solution method. The supercooling technique should be of considerable practical value because it yields very smooth layers of reproducible thickness over the range from tenths to tens of micrometers." @default.
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- W2000170037 date "1974-12-01" @default.
- W2000170037 modified "2023-10-02" @default.
- W2000170037 title "Thickness and surface morphology of GaAs LPE layers grown by supercooling, step-cooling, equilibrium-cooling, and two-phase solution techniques" @default.
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- W2000170037 doi "https://doi.org/10.1016/s0022-0248(74)80049-7" @default.
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