Matches in SemOpenAlex for { <https://semopenalex.org/work/W2000247885> ?p ?o ?g. }
- W2000247885 endingPage "1258" @default.
- W2000247885 startingPage "1251" @default.
- W2000247885 abstract "Abstract In the last decade, important technology solutions have been proposed to scale down Flash memory devices beyond the 30 nm node. The most important innovations are the introduction of charge trapping layer and high-κ materials in both bottom and top dielectric stacks. Such innovations allow reducing both the bottom dielectric thickness and the Program/Erase (P/E) voltages, while maintaining the P/E performances without degrading (theoretically) the memory device reliability. Theoretical advantages and reliability issues of these important innovations will be reviewed by addressing physical mechanisms responsible of reliability degradation. In particular, the reliability consequences of the discrete charge storage and of the high-κ band-gap engineered barriers bottom and top dielectric stacks will be carefully analyzed, relating high-κ material properties to memory device performances and reliability." @default.
- W2000247885 created "2016-06-24" @default.
- W2000247885 creator A5003731777 @default.
- W2000247885 creator A5083166491 @default.
- W2000247885 date "2010-09-01" @default.
- W2000247885 modified "2023-10-14" @default.
- W2000247885 title "High-κ related reliability issues in advanced non-volatile memories" @default.
- W2000247885 cites W1583860428 @default.
- W2000247885 cites W1640490173 @default.
- W2000247885 cites W1662474893 @default.
- W2000247885 cites W1965268851 @default.
- W2000247885 cites W1969167190 @default.
- W2000247885 cites W1970917862 @default.
- W2000247885 cites W1973948929 @default.
- W2000247885 cites W1975580831 @default.
- W2000247885 cites W1978161310 @default.
- W2000247885 cites W1980983632 @default.
- W2000247885 cites W1981347875 @default.
- W2000247885 cites W1983009794 @default.
- W2000247885 cites W1986860969 @default.
- W2000247885 cites W1988818932 @default.
- W2000247885 cites W2000490609 @default.
- W2000247885 cites W2003811072 @default.
- W2000247885 cites W2014163998 @default.
- W2000247885 cites W2017159197 @default.
- W2000247885 cites W2039200442 @default.
- W2000247885 cites W2045241540 @default.
- W2000247885 cites W2053445801 @default.
- W2000247885 cites W2053674573 @default.
- W2000247885 cites W2069279202 @default.
- W2000247885 cites W2071630674 @default.
- W2000247885 cites W2083945988 @default.
- W2000247885 cites W2088665385 @default.
- W2000247885 cites W2089310264 @default.
- W2000247885 cites W2095742538 @default.
- W2000247885 cites W2099164692 @default.
- W2000247885 cites W2101347989 @default.
- W2000247885 cites W2102465109 @default.
- W2000247885 cites W2103045052 @default.
- W2000247885 cites W2103586061 @default.
- W2000247885 cites W2105152280 @default.
- W2000247885 cites W2111608048 @default.
- W2000247885 cites W2112902759 @default.
- W2000247885 cites W2113712546 @default.
- W2000247885 cites W2114146406 @default.
- W2000247885 cites W2115415133 @default.
- W2000247885 cites W2128740882 @default.
- W2000247885 cites W2132255517 @default.
- W2000247885 cites W2135867339 @default.
- W2000247885 cites W2139004550 @default.
- W2000247885 cites W2141712155 @default.
- W2000247885 cites W2147383951 @default.
- W2000247885 cites W2147872592 @default.
- W2000247885 cites W2151550467 @default.
- W2000247885 cites W2151654658 @default.
- W2000247885 cites W2154240336 @default.
- W2000247885 cites W2156645272 @default.
- W2000247885 cites W2159809184 @default.
- W2000247885 cites W2161891272 @default.
- W2000247885 cites W2162108782 @default.
- W2000247885 cites W2162670105 @default.
- W2000247885 cites W2171266370 @default.
- W2000247885 cites W2299793380 @default.
- W2000247885 doi "https://doi.org/10.1016/j.microrel.2010.07.099" @default.
- W2000247885 hasPublicationYear "2010" @default.
- W2000247885 type Work @default.
- W2000247885 sameAs 2000247885 @default.
- W2000247885 citedByCount "14" @default.
- W2000247885 countsByYear W20002478852012 @default.
- W2000247885 countsByYear W20002478852013 @default.
- W2000247885 countsByYear W20002478852014 @default.
- W2000247885 countsByYear W20002478852017 @default.
- W2000247885 countsByYear W20002478852021 @default.
- W2000247885 crossrefType "journal-article" @default.
- W2000247885 hasAuthorship W2000247885A5003731777 @default.
- W2000247885 hasAuthorship W2000247885A5083166491 @default.
- W2000247885 hasConcept C121332964 @default.
- W2000247885 hasConcept C127413603 @default.
- W2000247885 hasConcept C163258240 @default.
- W2000247885 hasConcept C200601418 @default.
- W2000247885 hasConcept C41008148 @default.
- W2000247885 hasConcept C43214815 @default.
- W2000247885 hasConcept C62520636 @default.
- W2000247885 hasConceptScore W2000247885C121332964 @default.
- W2000247885 hasConceptScore W2000247885C127413603 @default.
- W2000247885 hasConceptScore W2000247885C163258240 @default.
- W2000247885 hasConceptScore W2000247885C200601418 @default.
- W2000247885 hasConceptScore W2000247885C41008148 @default.
- W2000247885 hasConceptScore W2000247885C43214815 @default.
- W2000247885 hasConceptScore W2000247885C62520636 @default.
- W2000247885 hasIssue "9-11" @default.
- W2000247885 hasLocation W20002478851 @default.
- W2000247885 hasOpenAccess W2000247885 @default.
- W2000247885 hasPrimaryLocation W20002478851 @default.
- W2000247885 hasRelatedWork W2355543518 @default.
- W2000247885 hasRelatedWork W2369695847 @default.
- W2000247885 hasRelatedWork W2374901194 @default.
- W2000247885 hasRelatedWork W2764722704 @default.